The University of Tokyo · Materials Science
Professor Naoya Shibata's research lab specializes in advanced electron microscopy, focusing on atomic-scale characterization of electric fields and defect structures in functional materials. The lab pioneers quantitative differential phase contrast STEM techniques to visualize and measure electrostatic potentials and electric fields with sub-angstrom resolution, enabling direct observation of atomic-scale electric fields in semiconductors and metals. A key research direction involves understanding the role of atomic-scale defects—such as dislocations and interfaces—in determining the electronic, optical, and mechanical properties of oxides and compound semiconductors. The lab also develops cutting-edge detector technologies, including high-speed segmented detectors, to enhance the spatial and temporal resolution of electron microscopy.
Figures are computed from collected data and may differ slightly.
In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding negative electrons within crystalline materials can be probed by atomic-resolution differential phase contrast STEM. Here we demonstrate the real-space imaging of the (projected) atomic electric field d
Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information is still a major challenge in microscopy. Here, differential phase contrast imaging in scanning transmission electron microscopy with segmented type detector is used to image a p-n junction in a GaAs
Little is known about dislocation core structures in oxides, despite their central importance in controlling electrical, optical, and mechanical properties. It has often been assumed, on the basis of charge considerations, that a nonstoichiometric core structure could not exist. We report atomic-resolution images that directly resolve the cation and anion sublattices in alumina (alpha-Al2O3). A dissociated basal edge dislocation is seen to consist of two cores; an aluminum column terminates one
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