Kyushu University · Materials Science
Professor Satoshi Hata's research lab specializes in advanced electron microscopy, focusing on the three-dimensional characterization of microstructures and atomic-scale phenomena in functional materials. The lab pioneers in-situ and electron tomography techniques to investigate dynamic processes such as deformation, phase transformations, and nanostructure evolution in superalloys, MgB2-based superconductors, and intermetallic compounds. Their work combines high-resolution transmission electron microscopy, energy-filtered imaging, and computed tomography algorithms to achieve detailed 3D reconstructions at nanoscale resolution. The lab also develops innovative sample preparation and data acquisition methods, including focused ion beam milling and fast tilt-series imaging, to enable real-time observation of material behavior under external stimuli.
Figures are computed from collected data and may differ slightly.
Microstructures of MgB2/Fe tapes fabricated by an in situ powder-in-tube method using MgH2 as a precursor powder have been studied by means of x-ray diffraction and analytical transmission electron microscopy combined with a focused ion beam microsampling technique. The overall microstructures in the tapes are characterized as densely crystallized MgB2 areas with 10–200 nm grain size, uncrystallized areas mainly containing MgO and amorphous phases enriched with B, and a number of holes and crack
Advanced electron tomography enables the visualization of 3D domain structures in crystalline materials (see figure) In this study, the morphology and composition ofγ′(L12-ordered) and γ (A1-disordered) domains formed in Ni-based NiAlTi superalloys are investigated by tomographic dark-field and energy-filtered transmission electronmicroscopy.
Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) enable the visualization of three-dimensional (3D) microstructures ranging from atomic to micrometer scales using 3D reconstruction techniques based on computed tomography algorithms. This 3D microscopy method is called electron tomography (ET) and has been utilized in the fields of materials science and engineering for more than two decades. Although atomic resolution is one of the current topics in ET r
The combination of in-situ and three-dimensional (3D) in transmission electron microscopy (TEM) is one of the emerging topics of recent advanced electron microscopy research. However, to date, there have been only handful examples of in-situ 3D TEM for material deformation dynamics. In this article, firstly, the authors briefly review technical developments in fast tilt-series dataset acquisition, which is a crucial technique for in-situ electron tomography (ET). Secondly, the authors showcase a
The atomic arrangements of short-range order (SRO) in two Al-rich γ-TiAl alloys with 62.5 and 60.0at.%Al respectively have been investigated by high-resolution transmission electron microscopy with image processing. For both alloys, SRO structures are formed in Ti-rich (002) layers of the L10 ordered γ-TiAl matrix, in the course of the phase transformation from the Al5 Ti3 long-period superstructure phase at lower temperatures to the h-Al2 Ti phase at higher temperatures. The SRO structures are
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