No-Chul Park
Yonsei University · Engineering
About the Lab
Professor No-Chul Park's research lab specializes in advanced optical technologies and structural analysis for high-precision applications. The lab focuses on diffractive optics, near-field microscopy, and optical metrology, with key contributions in the design and fabrication of miniaturized optical components such as diffractive optical elements (DOEs) and solid immersion lenses (SILs). It also conducts cutting-edge research in structural integrity analysis for nuclear reactor components, particularly using advanced finite element modeling and model reduction techniques to ensure safety and reliability under extreme conditions. The lab bridges fundamental optical physics with practical engineering applications in energy, nanotechnology, and biomedical imaging.
Research Overview
Research Output Trend
Figures are computed from collected data and may differ slightly.
Selected Papers
15Diffractive optical elements (DOEs) are key components in the miniaturization of optical systems because of their planarity and extreme thinness. We demonstrate the fabrication of DOEs by use of gray-scale photolithography with a high-energy-beam sensitive glass photomask. We obtained DOE lenses with continuous phase profiles as small as 800 microm in diameter and 5.9 microm in the outermost grating pitch by selecting a suitable optical density for each height level and optimizing the process va
We analyzed the behavior of the electric field in a focal plane consisting of a solid immersion lens (SIL), an air gap, and a measurement sample for radially polarized illumination in SIL-based near-field optics with an annular aperture. The analysis was based on the Debye diffraction integral and multiple beam interference. For SIL-based near-field optics whose NA is higher than unity, radially polarized light generates a smaller beam spot on the bottom surface of a SIL than circularly polarize
To secure reliability of the seismic design of the reactor vessel internals (RVIs) through the finite element analysis, it is important to develop the accurate analysis model which can represent the geometric complexity of the RVIs. However, the seismic analysis requires too large computation cost to solve the complex equations; thus, it needs to reduce the overall size of the analysis model. Here, we apply a model reduction method based on the fixed-interface component mode synthesis (CMS) meth
We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a speckle-free phase image, and reduces the possibility of a systematic error, which yields a high-quality topographic image. The proposed system can measure the surface topography in the range of nano- to micro-structures. The performance of the system is experimentally verified.
In recent years, there have been many research studies focusing on next generation optical data storage technologies, such as near-field recording and holographic data storage systems. Many studies from several disciplines have been perfoed and merged to realize of the next generation optical data storage. The technologies that have been developed for optical data storage are also essential for the other research areas. These technologies can be widely applied to various fields, such as near-fie
Nuclear power generates a large portion of the energy used today and plays an important role in energy development. To ensure safe nuclear power generation, it is essential to conduct an accurate analysis of reactor structural integrity. Accordingly, in this study, a methodology for obtaining accurate structural responses to the combined seismic and reactor coolant loads existing prior to the shutdown of a nuclear reactor is proposed. By applying the proposed analysis method to the reactor vesse
Abstract A multilayer ceramic capacitor (MLCC) vibrates when an electrical signal containing an alternating current (AC) component is applied to it. The piezoelectric and electrostrictive coefficients of the dielectric layer are needed to analyze such vibrations because both affect the vibration. Also, they must be determined for various direct current (DC) biases because an MLCC is operated with various electrical signals and the coefficients vary as the DC bias changes. We determined the coeff
Research Areas
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