The University of Osaka · 물리·천문학
M. Yamada 교수의 연구실은 반도체 내에서의 스핀 전송과 제어를 핵심으로 하는 스핀트로닉스 기반의 고성능 전자소자 기술을 연구하고 있습니다. 특히 고순도 게르마늄 기반의 저항성 스핀 인젝션, 극저온에서의 스핀 확산 길이 제어, 그리고 고밀도 메모리 소자 설계 기술을 융합한 혁신적 소자 구조를 개발하고 있습니다. 다양한 반도체 및 페로마그네틱 재료를 조합한 이종접합 구조를 통해 스핀 전자 소자의 성능을 극대화하는 데 초점을 맞추고 있습니다.
표시된 성과는 수집된 데이터 기준으로 산출되며, 일부 차이가 있을 수 있습니다.
Abstract Electrical injection of spin-polarized electrons from ferromagnets into semiconductors has been generally demonstrated through a tunneling process with insulator barrier layers that can dominate the device performance, including the electric power at the electrodes. Here, we show an efficient spin injection technique for a semiconductor using an atomically controlled ferromagnet/ferromagnet/semiconductor heterostructure with low-resistive Schottky-tunnel barriers. On the basis of symmet
We demonstrate the formation of abrupt phosphorus (P) δ-doping profiles in germanium (Ge) by the insertion of ultra-thin silicon (Si) layers. The Si layers at the δ-doping region significantly suppress the surface segregation of P during the molecular beam epitaxial growth of Ge and high-concentration active P donors are confined within a few nm of the initial doping position. The current-voltage characteristics of the P δ-doped layers with Si insertion show excellent Ohmic behaviors with low en
We experimentally show that the spin relaxation in degenerate $n$-type germanium (${n}^{+}$-Ge) depends strongly on the concentration of the donor impurity (${N}_{\mathrm{d}}$) at low temperatures. From measuring nonlocal spin signals for various lateral spin-valve devices at 8 and 77 K, the spin diffusion length (${\ensuremath{\lambda}}_{\mathrm{Ge}}$) of ${n}^{+}$-Ge can be estimated as a function of carrier concentration ($n$), i.e., ${N}_{\mathrm{d}}\ensuremath{\approx}n$ ($\ensuremath{\sim}
A multilevel storage (MLS) structure for high density CCD memory is proposed and demonstrated. Using four levels of charge, 2 bits can be stored in one storage cell. Stored charge is transferred by a clocking scheme which provides larger charge-carrying capacity without increasing memory cell size. These techniques make it possible to achieve high packing density without requiring fine patterning.
A novel Hi-C RAM cell is proposed for reducing the alpha-particle-induced soft error rate. The novel cell utilizes the doubly-implanted Hi-C struture combined with the boosted storage gate, which provides much alignment tolerance to the implantation steps for the Hi-C cell. This Hi-C cell having a charge storage capacity 30% larger than that of the conventional cell results in one order of magnitude decrease in soft errors as compared with the conventional one. The concept of this excellent cell
Utilizing a Si0.1Ge0.9 layer grown on Ge/Si(111) as a spin-transport channel and a Co2FeAl0.5Si0.5 ferromagnetic epilayer as a spin injector and detector, we demonstrate two-terminal local magnetoresistance signals at low temperatures in SiGe based lateral spin-valve devices. The magnitude of the local magnetoresistance signals is twice as large as that of nonlocal signals below 50 K. The local magnetoresistance signal can be observed up to 225 K, at which the nonlocal magnetoresistance signals
We report the highest two-terminal magnetoresistance (MR) ratio at room temperature in semiconductor (SC)-based vertical spin-valve (VSV) devices on a silicon (Si) platform. Here, we demonstrate all-epitaxial ferromagnet (FM)–germanium (Ge)–FM VSV devices with Co2FeSi as one of two FM electrodes. In addition to the high spin polarization of Co2FeSi, the relatively low resistance in the parallel magnetization state due to the strong Fermi-level-pinning effect at the p-type Ge/Co2FeSi interface ca
14β-Acetoxycodeinon und 14β-Bromcodeinon wurden mit T. sanguinea umgesetzt, wobei sich 14β-Hydroxycodein als gemeinsames Produkt gewinnen lieβ.
Using artificially controlled ferromagnet (FM)–semiconductor (SC) interfaces, we study the decay of the nonlocal spin signals with increasing temperature in SC-based lateral spin-valve devices. When more than five atomic layers of Fe are inserted at the FM/SC interfaces, the temperature-dependent spin injection/detection efficiency (Pinj/det) can be interpreted in terms of the T32 law, meaning a model of the thermally excited spin waves in the FM electrodes. For the FM/SC interfaces with the ins
Using pure spin current transport measurements in lateral spin-valve devices, we study the spin relaxation in an $n$-type nondegenerate Ge layer, which is moderately doped Ge (P: $\ensuremath{\sim}{10}^{18}$ ${\mathrm{cm}}^{\ensuremath{-}3}$). The obtained spin diffusion length $({\ensuremath{\lambda}}_{\mathrm{Ge}})$ of the nondegenerate Ge is two to three times greater than that of heavily doped degenerate Ge (P: $\ensuremath{\sim}{10}^{19}$ ${\mathrm{cm}}^{\ensuremath{-}3}$) in the temperatur