The University of Tokyo · 재료과학
나오후아 시바타 교수의 연구실은 원자 해상도 전자현미경 기반의 전기장 및 전하 분포 분석을 핵심으로 하며, 나노스케일에서의 국소 전기장, 결정 결함, 그리고 이온 결합 산화물 내 불량 구조의 원자 구조를 직접 관찰하는 데 전문성을 가진다. 특히, 분할된 결정 결함의 비스토이키오메트릭 핵 구조나 반도체 접합부의 내재 전기장 분포를 고해상도 STEM을 통해 정량적으로 규명하고 있다. 이는 나노소재의 전기적, 기계적 성질 제어에 핵심적인 기초 자료를 제공한다.
표시된 성과는 수집된 데이터 기준으로 산출되며, 일부 차이가 있을 수 있습니다.
In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding negative electrons within crystalline materials can be probed by atomic-resolution differential phase contrast STEM. Here we demonstrate the real-space imaging of the (projected) atomic electric field d
Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information is still a major challenge in microscopy. Here, differential phase contrast imaging in scanning transmission electron microscopy with segmented type detector is used to image a p-n junction in a GaAs
Little is known about dislocation core structures in oxides, despite their central importance in controlling electrical, optical, and mechanical properties. It has often been assumed, on the basis of charge considerations, that a nonstoichiometric core structure could not exist. We report atomic-resolution images that directly resolve the cation and anion sublattices in alumina (alpha-Al2O3). A dissociated basal edge dislocation is seen to consist of two cores; an aluminum column terminates one
