Suk Joo Bae
한양대학교 산업공학과 · 공학
Suk Joo Bae 교수의 연구실은 신뢰성 공학과 통계적 모델링을 기반으로 한 고도화된 제품 신뢰성 평가 기법을 개발하고 있습니다. 주로 플라즈마 디스플레이 패널(PDP) 및 집적회로 웨이퍼와 같은 반도체 소자에서 발생하는 비선형 열화 현상에 대해 비모수적이고 랜덤 계수를 포함한 통계적 모델을 제안하며, 특히 번인( burn-in) 효과와 나노오염에 의한 열화를 정량적으로 분석합니다. 또한, 결함의 공간적 분포나 질병 유병률과 같은 복잡한 데이터 구조를 다루기 위한 다변량 통계 모형 및 메타분석 기법도 응용하고 있습니다.
표시된 성과는 수집된 데이터 기준으로 산출되며, 일부 차이가 있을 수 있습니다.
AbstractAs an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents a degradation model for highly reliable light displays, such as plasma display panels and vacuum fluorescent displays (VFDs). Standard degradation models fail to capture the burn-in characteristics of VFDs, when emitted light actually increases up to a certain point in time before it d
In testing display devices such as Plasma Display Panels (PDPs), the observed degradation in luminosity can exhibit an unstable period due to incomplete burn-in during the manufacturing process. We introduce a log-linear model with random coefficients and a change point to describe the nonlinear degradation path. The change point represents the time at which the burn-in period has finished and the degradation in the luminosity changes to a slower and more stable rate. The inference procedure for
Malaria is one of the major public health issues globally. Malaria infection spreads through mosquito bites from infected female Anopheles mosquitoes. This study aims to conduct a systematic review and meta-analysis on malaria prevalence in Pakistan from 2006 to 2021. We searched PubMed, Science Direct, EMBASE, EMCare, and Google Scholar to acquire data on the prevalence of malaria infections. We performed a meta-analysis with a random-effects model to obtain the pooled prevalence of malaria, Pl
As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article proposes a new model to describe the nonlinear degradation paths caused by nano-contamination in plasma display panels (PDP): a bi-exponential model with random coefficients. A likelihood ratio test was sequentially executed to select random effects in the nonlinear model. Analysis results indicate tha
In this paper we propose spatial modeling approaches for clustered defects observed using an Integrated Circuit (IC) wafer map. We use the spatial location of each IC chip on the wafer as a covariate for the corresponding defect count listed in the wafer map. Our models are based on a Poisson regression, a negative binomial regression, and Zero-Inflated Poisson (ZIP) regression. Analysis results indicate that yield prediction can be greatly improved by capturing the spatial distribution of defec
