東京大学 · 材料科学
Naoya Shibata教授の研究室は、電子顕微鏡を用いたナノスケールの電場・電位構造の直接可視化を柱としています。特に、走査型透過電子顕微鏡（STEM）を応用し、原子分解能で電場分布を測定・イメージングする差動位相コントラスト法の開発・応用に力を入れています。酸化物や半導体における不純度や不配位子欠陥の電気的・構造的性質の解明も重要なテーマです。
Figures are computed from collected data and may differ slightly.
In scanning transmission electron microscopy (STEM), single atoms can be imaged by detecting electrons scattered through high angles using post-specimen, annular-type detectors. Recently, it has been shown that the atomic-scale electric field of both the positive atomic nuclei and the surrounding negative electrons within crystalline materials can be probed by atomic-resolution differential phase contrast STEM. Here we demonstrate the real-space imaging of the (projected) atomic electric field d
Precise measurement and characterization of electrostatic potential structures and the concomitant electric fields at nanodimensions are essential to understand and control the properties of modern materials and devices. However, directly observing and measuring such local electric field information is still a major challenge in microscopy. Here, differential phase contrast imaging in scanning transmission electron microscopy with segmented type detector is used to image a p-n junction in a GaAs
Little is known about dislocation core structures in oxides, despite their central importance in controlling electrical, optical, and mechanical properties. It has often been assumed, on the basis of charge considerations, that a nonstoichiometric core structure could not exist. We report atomic-resolution images that directly resolve the cation and anion sublattices in alumina (alpha-Al2O3). A dissociated basal edge dislocation is seen to consist of two cores; an aluminum column terminates one
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