Korea Advanced Institute of Science and Technology · Engineering
Sang-Hee Ko Park 교수의 연구실은 유연하고 투명한 전자소자에 초점을 맞추고 있으며, 특히 유연한 산화물 투명 트랜지스터, 페로일렉트릭 허미아(Fe-HZO) 소재를 활용한 초고속 스위칭 소자, 그리고 나노구조 기반의 고민감 압력 센서 등 차세대 유연 전자소자에 대한 핵심 기술을 개발하고 있습니다. 특히 원자층증착(atomic layer deposition) 기반의 고성능 산화막 및 전극 구조 설계를 통해 소자의 안정성과 성능을 극대화하는 데 주력하고 있습니다. 연구는 반도체 소자, 스마트 디스플레이, 웨어러블 센서 등 미래형 통합 전자소자 응용을 목표로 하고 있습니다.
Figures are computed from collected data and may differ slightly.
Recently, hafnia ferroelectrics with two spontaneous polarization states have attracted marked attention for non-volatile, super-steep switching devices, and neuromorphic application due to their fast switching, scalability, and CMOS compatibility. However, field cycling-induced instabilities are a serious obstacle in the practical application of various low-power electronic devices that require a settled characteristic of polarization hysteresis. In this work, a large reduction in the field cyc
Fabrication of barrier layers on a PES film and an organic light emitting diode (OLED) based on a glass substrate by atomic layer deposition (ALD) have been carried out. Deposition of 30 nm of film on both sides of PES film at 90°C gave film MOCON value of The passivation performance of the double layer consisting of deposited by plasma-enhanced chemical vapor deposition and by ALD on the OLED has been investigated using the OLED based on a glass substrate. Preliminary life time of two pairs of
Flexible transparent display is a promising candidate to visually communicate with each other in the future Internet of Things era. The flexible oxide thin‐film transistors (TFTs) have attracted attention as a component for transparent display by its high performance and high transparency. The critical issue of flexible oxide TFTs for practical display applications, however, is the realization on transparent and flexible substrate without any damage and characteristic degradation. Here, the ultr
Transparent ZnO thin film transistor (TFT) array of 176 x 144 (106 dpi) was fabricated on glass substrate. The V-th of the TFT with inverted coplanar structure is about 0.8 V and the mobility is 1.13 cm(2)/V s. The active layer (ZnO), gate insulator (Al2O3), and source-drain electrode (ZnO:Al) were deposited by atomic layer deposition. We also compared the performance of TFTs fabricated by lift-off and wet-etching process as the patterning processes of ZnO layer. The carrier density of the ZnO l
We fabricated amorphous InGaZnO thin film transistors (a-IGZO TFTs) with aluminum oxide (Al<sub>2</sub>O<sub>3</sub>) as a gate insulator grown through atomic layer deposition (ALD) method at different deposition temperatures (<i>T</i> <sub>dep</sub>). The Al<sub>2</sub>O<sub>3</sub> gate insulator with a low <i>T</i> <sub>dep</sub> exhibited a high amount of hydrogen in the film, and the relationship between the hydrogen content and the electrical properties of the TFTs was investigated. The de
Highly sensitive and flexible pressure sensors were developed based on dielectric membranes composed of insulating microbeads contained within polyvinylidene fluoride (PVDF) nanofibers. The membrane is fabricated using a simple electrospinning process. The presence of the microbeads enhances porosity, which in turn enhances the sensitivity (1.12 kPa<sup>-1</sup> for the range of 0-1 kPa) of the membrane when used as a pressure sensor. The microbeads are fixed in position and uniformly distribute
Abstract A memristive nonvolatile logic‐in‐memory circuit can provide a novel energy‐efficient computing architecture for battery‐powered flexible electronics. However, the cell‐to‐cell interference existing in the memristor crossbar array impedes both the reading process and parallel computing. Here, it is demonstrated that integration of an amorphous In‐Zn‐Sn‐O (a‐IZTO) semiconductor‐based selector (1S) device and a poly(1,3,5‐trivinyl‐1,3,5‐trimethyl cyclotrisiloxane) (pV3D3)‐based memristor
Zinc oxide films were grown in a temperature range of by plasma-enhanced ALD for the application of flexible transparent thin-film transistor (TFT). We have investigated the effect of precursor pulsing time, temperature, and radio frequency power on the film growth. The X-ray diffraction patterns of polycrystalline ZnO films showed rather preferred (002) orientation even at a low temperature of . We could obtain highly resistant ZnO film, being suitable for the active layer of TFT, at low temper
Transparent conductive, Al-doped ZnO films (ZnO:Al) have been deposited by means of an atomic layer deposition method with the surface chemical compositions of ZnO (film A) and Al 2 O 3 (film B). The sheet resistance, surface work function, and structure characteristics of ZnO:Al films have been investigated. Organic light emitting diodes (OLEDs) were fabricated on glass substrates using two different ZnO:Al anodes. The devices fabricated with them exhibited higher current and luminance with hig
This study proposes double oxide semiconductors as a strategy for human-brain like energy consuming synaptic transistor. IZO/IGZO synaptic transistor consumed a minimum energy of 0.269 fJ, and successfully mimicked various synaptic plasticity.
Abstract We have fabricated 2.5″ QCIF + bottom emission AM‐OLED with aperture ratio of 59.6% using fully transparent ZnO‐TFT array and highly conductive oxide/metal/oxide electrode for the first time. The bias stability of ZnO TFT was improved by optimizing ZnO deposition and first gate insulator process. Plasma free process for the gate insulator makes ZnO TFT very stable under electrical bias stress. The Vth shift was less than 0.3V after V DS =25 V and V GS =15 V application for 60 hours. Tra
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