Pohang University of Science and Technology · 工学
Professor Yoon-Uk Heo's research lab specializes in advanced electron microscopy and materials characterization, focusing on the microstructural analysis of metallic alloys at the atomic scale. The lab employs cutting-edge techniques such as electron energy loss spectroscopy (EELS) and convergent beam electron diffraction (CBED) to investigate thickness-dependent properties and phase transformations in materials like Fe-Mn-C alloys. Their work emphasizes quantitative analysis of thin films and foils, particularly through the integration of EELS log-ratio methods and Kossel-Möllenstedt fringe analysis for precise thickness measurement. The lab's research contributes significantly to understanding deformation mechanisms and phase stability in advanced structural materials.
Figures are computed from collected data and may differ slightly.
Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-Möllenstedt (
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