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Jang-soo Lee

Korea Advanced Institute of Science and Technology · 情報科学

研究室紹介

Professor Jang-soo Lee's research lab specializes in nuclear safety and instrumentation & control (I&C) systems, with a focus on hazard analysis, risk assessment, and the resilience of nuclear power plants against both internal failures and external events such as natural disasters. The lab investigates the logical and physical relationships between system faults and safety function degradation, emphasizing the impact of extreme external hazards like tsunamis on I&C systems. Research directions include the development of systematic hazard analysis methodologies and the evaluation of compliance with international safety standards.

nuclear safetyhazard analysisI&C systemsrisk assessmentnatural hazards

Research Overview

Papers
3
Total Citations
1
Papers (5y)
3
Primary Field
情報科学

Research Output Trend

Figures are computed from collected data and may differ slightly.

Publications per year (5y)
3total
2003
2011
2014
Citations per year (5y)
1total
200320112014

Selected Papers

3
1
Article|1 citations·2011
State-of-the-art report for the testing and formal verification methods for FBD program
Eun Kyoung Jee, Jang Soo Lee, Young Jun Lee, Jun Beom Yoo
Hardware and ArchitectureComputer Science
2
Article|0 citations·2014
Comparison of Hazard Analysis Requirements for Instrumentation and Control System of Nuclear Power Plants
Jang Soo Lee, Jun Beom Yoo

A hazard, in general, is defined as potential for harm. In this paper, the scope of is limited to the loss of a safety function in a Nuclear Power Plant (NPP). The Hazard Analysis (HA) of an Instrumentation and Control (I&C) systems is to identify the relationship from the logical faults, error, and failure of I&C systems to the physical harm of the nuclear power plant, and also to find the impact of the external hazard, e.g., tsunami, of the nuclear power plant to the I&C systems. This paper in

Statistics, Probability and UncertaintyDecision Sciences
3
Article|0 citations·2003
Verification and Testing of the RTOS for Safety-Critical Embedded Systems
Na Young Lee, Jin Hyun Kim, Ah Young Sung, Byoung Ju Choi, Jin‐Young Choi, Jang Soo Lee
Transactions of the American Nuclear Society
Hardware and ArchitectureComputer Science

Research Areas

Hardware and ArchitectureStatistics, Probability and Uncertainty

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