Skip to main content

Kee-Yong Lee

Yonsei University

研究室紹介

Professor Kee-Yong Lee's research lab specializes in the development and characterization of advanced oxide semiconductors and functional thin films for next-generation electronic and optoelectronic devices. Key research directions include transparent thin-film transistors based on amorphous oxide semiconductors like InGaZnO (a-IGZO), phase-transition materials such as VO2 for tunable electronic and switching behaviors, and the integration of these materials into flexible and transparent electronics. The lab employs combinatorial thin-film synthesis and in-situ electrical measurements to explore structure-property relationships, particularly focusing on mobility, threshold voltage, and resistive switching dynamics in oxide-based devices.

oxide semiconductorstransparent transistorsVO2 phase transitionthin-film devicescombinatorial synthesis

Research Overview

Papers
2
Total Citations
9
Papers (5y)
2
Primary Field

Research Output Trend

Figures are computed from collected data and may differ slightly.

Publications per year (5y)
2total
2008
2017
Citations per year (5y)
9total
20082017

Selected Papers

2
1
Article|8 citations·2008
Amorphous In-Ga-Zn-O Transparent Thin-film Transistors Prepared by Using a Combinatorial Approach
주홍렬, Joonchul Moon, 신용수, 이기용, 임영철, Sanghui Kim, Changwoo Park

Transparent thin-film transistors (TTFTs) with amorphous InGaZnO (a-IGZO) channels have ben prepared by using a combinatorial thin-film synthesis approach. The In composition ratio, In(%)[= In×10 In+Zn+Ga(%)], of the channel of the TTFTs varied with position from 50% to 85%. This alowed us to study TTFTs characteristics as a function of channel composition. The mobility, the on-off ratio and the threshold voltage of the TTFTs varied from 0.2 cm/V·s to 13 cm/V·s, 3 × 100 to 8 × 107 and -24 to 20

2
Article|1 citations·2017
Investigation on I-V characteristics of current induced metal insulator transition in VO2 device
이기용, 김호원, 문봉진, 박창우, 주홍렬

The I-V characteristics of two terminal planar VO2 film devices are investigated as the devices undergo the current induced metal insulator transition (I-MIT). The I-MIT occured when the device resistivity reached ~7 Ucm, where metallic grains formed initial conductive current path within insulating matrix. The transition time needed for the I-MIT increased with increasing external resistance, REXT, connected to the device in series, i.e. ~390 ms (REXT ¼ 5 kU) to ~1400 ms (REXT ¼ 20 kU). The tra

Kee-Yong Leeの研究をNubintでさらに深く

この研究室の論文をアプリで開き、AIと共に読み、要約し、引用しましょう。