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Lee Hosun

Kyung Hee University · 材料科学

研究室紹介

Professor Lee Hosun's research lab specializes in the optical and electronic characterization of advanced functional materials, with a focus on complex oxides, chalcogenides, nitrides, and fluorinated carbon films. The lab employs advanced spectroscopic techniques such as spectroscopic ellipsometry, Raman spectroscopy, and dielectric function analysis to investigate critical electronic and vibrational properties, including band gaps, critical point parameters, and carrier dynamics. A key research direction involves understanding the impact of composition, disorder, and structural ordering—such as CuPt-type ordering—on optical transitions and electronic band structures in semiconductors and ferroelectrics. The lab also extends into mechatronics, developing advanced torque control algorithms for robotic systems using disturbance observer and PI control strategies.

spectroscopic ellipsometrydielectric functioncritical point modelsemiconductor heterostructuresoptical properties

Research Overview

Papers
163
Total Citations
2,169
Papers (5y)
26
Primary Field
材料科学

Research Output Trend

Figures are computed from collected data and may differ slightly.

Publications per year (5y)
26total
2022
2023
2024
2025
2026
Citations per year (5y)
103total
20222023202420252026

Selected Papers

15
1
Article|72 citations·2005
Dielectric functions and electronic band structure of lead zirconate titanate thin films
Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, H. Morkoç, Tae Dong Kang, Ghil Soo Lee, Jingbo Li, Su‐Huai Wei, Paul G. Snyder, J. T. Evans
SJR Q2Journal of Applied Physics

We measure pseudodielectric functions in the visible-deep ultraviolet spectral range of Pb(ZrxTi1−x)O3 (x=0.2,0.56,0.82) (PZT), Pb0.98Nb0.04(Zr0.2Ti0.8)0.96O3, Pb0.91La0.09(Zr0.65Ti0.35)0.98O3, and Pb0.85La0.15Ti0.96O3 films grown on platinized silicon substrates using a sol-gel method and on (0001) sapphire using a radio-frequency sputtering method. Using a parametric optical constant model, we estimate the dielectric functions (ϵ) of the perovskite oxide thin films. Taking the second derivativ

Materials ChemistryMaterials Science
2
Article|31 citations·2001
Spectroscopic ellipsometry and Raman study of fluorinated nanocrystalline carbon thin films
Hosun Lee, In Young Kim, S. S. Han, Byeong‐Soo Bae, Myung-Ryul Choi, In‐Sang Yang
SJR Q2Journal of Applied Physics

Using spectroscopic ellipsometry and Raman spectroscopy, we measured the pseudodielectric function and the phonon frequencies of fluorinated nanocrystalline carbon (nc-C:F) thin films grown on silicon substrate at varying growth temperature and gas flux ratio of CH4 and CF4. Utilizing the Tauc–Lorentzian formula, we performed multilayer analysis to estimate the dielectric function of the fluorinated nanocrystalline carbon thin films. We also adopted Gaussian-like density-of-states model proposed

Materials ChemistryMaterials Science
3
Article|24 citations·2020
Effect of layer number on the properties of stable and flexible perovskite solar cells using two dimensional material
Dae Ho Jung, Ye Jin Oh, Yeon Seo Nam, Hosun Lee
SJR Q1Journal of Alloys and Compounds
Electrical and Electronic EngineeringEngineering
4
Article|22 citations·2000
Visible-near ultraviolet ellipsometric study of Zn1−xMgxSe and Zn1−xBexSe alloys
Hosun Lee, In Young Kim, J. A. Powell, D. E. Aspnes, Sang‐Hoon Lee, F. C. Peiris, J. K. Furdyna
SJR Q2Journal of Applied Physics

We report pseudodielectric function data 〈ε〉=〈ε1〉+i〈ε2〉 of Zn1−xMgxSe and Zn1−xBexSe samples grown on GaAs substrates. The data were obtained from 1.5 to 6.0 eV using spectroscopic ellipsometry. Critical point parameters were obtained by fitting model line shapes to numerically calculated second energy derivatives of 〈ε〉, from which the bowing parameters and spin-orbit-splitting Δ1 of the E1 and E1+Δ1 gaps were obtained. A transfer of oscillator strength from E1+Δ1 to E1 with increasing Mg and B

Electrical and Electronic EngineeringEngineering
5
Article|21 citations·2010
Torque sensor based robot arm control using disturbance observer
Hosun Lee, Yonghwan Oh, Jae-Bok Song
ICCAS 2010

In this paper, a robust torque control method is proposed for a robot arm which is equipped with joint torque sensor. The proposed controller is used to control the joint torque and make it to be equal with the torque controller reference input torque. A flexible joint robot model will be introduced to model the robot arm system. The disturbance observer scheme is used to reduce the disturbance effects on the system. The PI torque controller is implemented using the characteristics of disturbanc

Control and Systems EngineeringEngineering
6
Article|19 citations·2012
Structural and optical properties of phase‐change amorphous and crystalline Ge1 − xTex (0 < x < 1) thin films
Jun‐Woo Park, Misun Song, Seokhyun Yoon, Hyungkwang Lim, Doo Seok Jeong, Byung‐ki Cheong, Hosun Lee
SJR Q2physica status solidi (a)

Abstract Ge 1 − x Te x thin films were grown using thermal coevaporation deposition. The dielectric functions and the phonon modes of amorphous (a‐) and crystalline (c‐) Ge 1 − x Te x films were measured using spectroscopic ellipsometry and Raman spectroscopy in order to investigate electronic and vibrational properties of these alloys. Using the second derivative spectra of the dielectric functions of a‐Ge 1 − x Te x alloys and the standard critical point (SCP) model, we obtained optical transi

Materials ChemistryMaterials Science
7
Article|18 citations·2005
Visible-ultraviolet spectroscopic ellipsometry of lead zirconate titanate thin films
Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Bo Xiao, H. Morkoç̌, Tae Dong Kang
SJR Q1Applied Physics Letters

We measured pseudodielectric functions in the visible-ultraviolet spectral range of Pb(ZrxTi1−x)O3 (x=0.2, 0.56, 0.82) (PZT) grown on platinized silicon substrate using the sol-gel method and also on (0001) sapphire using radio frequency sputtering method. Using a parametric optical constant model, we estimated the dielectric functions of the PZT thin films. Taking the second derivative of the fitted layer dielectric functions and using the standard critical point model, we determined the parame

Materials ChemistryMaterials Science
8
Article|18 citations·1996
CuPt-type ordering and dopant effect ofIn0.5Ga0.5P/GaAs using spectroscopic ellipsometry
Hosun Lee, M. V. Klein, J. M. Olson, K. C. Hsieh
Physical review. B, Condensed matter

The CuPt-type ordering and dopant effects of ${\mathrm{In}}_{0.5}$${\mathrm{Ga}}_{0.5}$P/GaAs epitaxial layers have been studied using spectroscopic ellipsometry and transmission electron microscopy. The degree of ordering was estimated by both transmission electron diffraction and the position of the direct band edge ${E}_{0}$. Conventional line-shape fitting of ${E}_{1}$, ${E}_{1}+{\ensuremath{\Delta}}_{1}$, and ${E}_{0}$ gaps using the second derivative of pseudodielectric functions shows tha

Atomic and Molecular Physics, and OpticsPhysics and Astronomy
9
Article|17 citations·2022
High-performance and high-stability LaVO3/Si solar cells through employing thickness-controlled LaVO3 and a titanium oxide passivation layer
Dae Ho Jung, Jeong Woo Hwang, Jae Jun Lee, Dong Hee Shin, Hosun Lee
SJR Q1Journal of Alloys and Compounds
Electrical and Electronic EngineeringEngineering
10
Article|16 citations·2004
Ellipsometry on uniaxial ZnO and Zn1−xMgxO thin films grown on (0001) sapphire substrate
Tae Dong Kang, Hosun Lee, Won Il Park, Gyu‐Chul Yi
SJR Q2Thin Solid Films
Materials ChemistryMaterials Science
11
Article|15 citations·2021
The optical and electrical properties of amorphous gallium/titanium co-doped indium oxide films based on oxygen flow dependence
Dae Ho Jung, Ye-Jin Oh, Sang-Hwi Lim, Han‐Ki Kim, Hosun Lee
SJR Q2Journal of Applied Physics

Amorphous gallium/titanium (Ga,Ti) co-doped indium oxide (In2O3) (GTiIO) films present significant potential as transparent conducting electrodes for use in flexible electronic devices. Amorphous GTiIO films were grown on silicon and glass substrates using linear-facing target sputtering and various oxygen flow rates. Transmittance was as high as 80% in the visible range for O2 flow rates of 0.3, 0.7, and 1.0 SCCM. The lowest resistivity was obtained at f(O2) = 0.3 SCCM with 0.47 mΩ cm. Dielectr

Electrical and Electronic EngineeringEngineering
12
Article|15 citations·2007
Cost Comparison of Pipeline Asset Replacement: Open-Cut and Pipe-Bursting
Hosun Lee, Mohammad Najafi, Johnny Matthys

The costs of trenchless projects can vary widely with many factors such as the project size, length, depth, location, surface and subsurface conditions, type of application, etc. Although there have been several studies regarding the cost comparison of trenchless with open-cut methods, practical examples of verifying the reasonableness of actual trenchless construction/replacement costs are still needed. In this paper, the cost of an actual pipe bursting project on the campus of Michigan State U

Civil and Structural EngineeringEngineering
13
Article|14 citations·2024
Graphene/WS2/LaVO3 heterojunction for self-powered, high-speed, and broadband photodetectors
Donghee Shin, Hosun Lee
SJR Q2Current Applied Physics
Materials ChemistryMaterials Science
14
Article|12 citations·2010
Optical Study of InZnO/Ag/InZnO Thin Films Grown on Glass Substrate Studied with Spectroscopic Ellipsometry: Plasmon and Antireflection Effect
Hosun Lee, Hosuk Lee, Junwoo Park, Yong Seok Park, Han‐Ki Kim
SJR Q3Journal of the Korean Physical Society
Materials ChemistryMaterials Science
15
Article|12 citations·2022
A high-performance broadband self-powered photodetector employing an MoS2/LaVO3 heterojunction structure
Jae Jun Lee, Dong Hee Shin, Dae Ho Jung, Si Duck Oh, Hosun Lee
SJR Q1Journal of Alloys and Compounds
Materials ChemistryMaterials Science

Research Areas

Materials ChemistryElectrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsElectronic, Optical and Magnetic MaterialsPolymers and PlasticsControl and Systems Engineering

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