최성민 교수
Sung‐Min Choi
KAIST 원자력및양자공학과 · 공학
연구실 소개
최성민 교수의 연구실은 전기장 및 자기장에 의한 빛의 편광 상태 변화를 이용한 고속 비접촉 전기측정 기술을 핵심으로 하며, 주로 X-핀치 및 가속기와 같은 고에너지 펄스 전압 장치에서의 정밀 전압·전류 측정을 목표로 합니다. 리튬니오브산타늄(LiNbO₃) 기반의 Pockels 효과 기반 진단 시스템을 개발하여, 반도체 기반의 고속·고정밀 측정 기술을 구현하고 있습니다. 특히, 반파장 전압(Vπ)에 대한 불확실성과 광학적 불균형을 보정하는 고도화된 다이내믹 데이터 분석 기법을 통해 측정 정확도를 극대화하고 있습니다.
연구 현황
연구 성과 추이
표시된 성과는 수집된 데이터 기준으로 산출되며, 일부 차이가 있을 수 있습니다.
주요 논문
9A voltage measurement system based on the Pockels electro-optic effect typically has, due to a half-wave voltage Vπ of a Pockels cell, a limitation on the unambiguous measurable range. To overcome such a limitation, we develop a polar-coordinate-based data analysis scheme with a simultaneous measurement of cos(π V/Vπ) and sin(π V/Vπ), where V is the voltage the Pockels cell experiences, i.e., the voltage we wish to measure. The developed data analysis scheme also corrects, without knowledge of V
Having a sub-ns response time and not requiring physical contacts to the measurement points, a voltage measurement system based on the Pockels electro-optic effect, referred to as a PE (Pockels effect)-based voltmeter, is widely used for pulsed high voltage devices such as accelerators and X-pinch systems. To correct for the misalignment of a Pockels cell and the transmittance ratio of a beam splitter, a polar-coordinate-based data analysis scheme has been proposed. This scheme also overcomes a
Abstract A diagnostic system using the Pockels effect (linear electro-optic effect) has been developed to measure a voltage on a load of the SNU X-pinch device [Ryu et al., Rev. Sci. Instrum. 92, 053533 (2021)]. The sensor component of the diagnostic system comprises of a lithium niobate (LN) crystal and its mount. When the LN crystal is subjected to an external electric field, the refractive indices of the LN crystal change due to the Pockels effect, leading to a change in the polarization stat
Optics-based measurement systems have been developed to measure the voltage and the current on a load of the Seoul National University X-pinch device [Ryu et al., Rev. Sci. Instrum. 92, 053533 (2021)]. A lithium niobate crystal that changes the polarization state of the propagating laser beam due to the Pockels effect induced by the electric field across the crystal, thus capable of measuring the voltage, is located next to the load. For the current measurement, an optic fiber is wound around th
Neutron science and technology, the utilization of neutron beams for a wide variety of scientific and engineering research ranging from materials and life science to industrial applications, has been one of the key elements of modern science and technology. Currently, the neutron science and technology in Korea is in rapid growth with the operation of the 30 MW High-flux Advanced Neutron Application Reactor (HANARO) at the Korea Atomic Energy Research Institute, which is one of the most powerful
This study investigates the characteristics of X-pinch plasmas driven under low current rise rate ($dI/dt$) conditions using soft x-ray spectroscopy combined with the Bennett relation. X-pinch experiments were conducted on the SNU X-pinch device using copper wires at a low $dI/dt$ of 0.2-0.3 kA/ns. The resulting 1-10 keV soft x-ray signals, measured by an x-ray filtered AXUV photodiode array (XFPA), exhibit significant nonlinear effects due to the high intensity of the soft x-ray pulses. This wo
Abstract A collective Thomson scattering (CTS) diagnostic system has been commissioned to measure the ion features of the jet plasma region of X-pinch plasma, including electron temperature, ion temperature, electron density, average charge state, and plasma bulk velocity. Due to the inherent nature of CTS, signals with two peaks within a very narrow wavelength range are observed, depending on the ion motion. To analyze CTS signals, a spectrometer with a high dispersion and high resolution is re
This study investigates the characteristics of X-pinch plasmas driven under low current rise rate ($dI/dt$) conditions using soft x-ray spectroscopy combined with the Bennett relation. X-pinch experiments were conducted on the SNU X-pinch device using copper wires at a low $dI/dt$ of 0.2-0.3 kA/ns. The resulting 1-10 keV soft x-ray signals, measured by an x-ray filtered AXUV photodiode array (XFPA), exhibit significant nonlinear effects due to the high intensity of the soft x-ray pulses. This wo
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